Jeol JEM 2100F - FEG microscope

Transmission electron microscopes (TEM)

Photo: Kim Ramberghaug/NTNU

The Jeol TEMs are included in a Jeol Competence Centre. The three Jeol TEMs installed in 2013 are part of the NORTEM project. Together they cover a broad range of techniques and access levels.

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Jeol JEM 2100F - FEG microscope

This FEG TEM is optimized for all-round advanced materials studies with a special focus on precession diffraction, orientation mapping and tomography.

The JEM 2100F is optimized for STEM and HREM. In addition it has an ASTAR orientation mapping set-up and is our main instrumment for electron tomography.

200 kV Schottky field emission gun (FEG), energy spread 0.7 eV
Gatan 2k UltraScan CCD, bottom mounted.
Scanning option with BF and HAADF detector
Quantum Detectors single-chip (256x256) MerlinEM direct electron detector
Oxford X-Max 80 SDD EDX, solid angle 0.23 sr
ASTAR orientation mapping system
Gatan TEM/STEM tomography
Gatan GMS 2.2, 64 bit

Holders

Single tilt holders, double tilt holders (+/- 30 degrees), cold stage holder, heating holder, environmental cell/transfer holders, tomography holders and a rotation holder.