Microscopes - TEM Gemini Centre

Transmission electron microscopes (TEM)

Photo: Kim Ramberghaug/NTNU

The Jeol TEMs are included in a Jeol Competence Centre. The three Jeol TEMs installed in 2013 are part of the NORTEM project. Together they cover a broad range of techniques and access levels.

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Jeol JEM ARM200F - Double corrected ColdFEG microscope

Jeol JEM ARM200F - Double corrected ColdFEG microscope This is one of the most advanced TEMs currently in Europe. The stable coldFEG with both probe and image spherical...

Jeol JEM 2100F - FEG microscope

Jeol JEM 2100F - FEG microscope This FEG TEM is optimized for all-round advanced materials studies with a special focus on precession diffraction, orientation mapping and...

Jeol JEM 2100 - LaB6 microscope

Jeol JEM 2100 - LaB6 microscope The 2100 LaB6 is the workhorse for routine TEM studies, configured for easy access and a broad user group. This is the instrument new users are...