Jeol JEM 2100 - LaB6 microscope

Transmission electron microscopes (TEM)

Photo: Kim Ramberghaug/NTNU

The Jeol TEMs are included in a Jeol Competence Centre. The three Jeol TEMs installed in 2013 are part of the NORTEM project. Together they cover a broad range of techniques and access levels.

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Jeol JEM 2100 - LaB6 microscope

The 2100 LaB6 is the workhorse for routine TEM studies, configured for easy access and a broad user group. This is the instrument new users are trained on. The set-up is optimized for conventional TEM techniques as BF/DFTEM and SAED and is equipped with a GIF, an SDD EDX and scanning unit.

200 kV LaB6 filament. Aligned and calibrated at 120 and 200 kV.
Gatan 2k Orius CCD (side mounted, large view) and negatives.
Scanning option with BF and HAADF detectors.
GIF system with 2k CCD, aligned at 120 and 200 kV.
Oxford X-Max 80 SDD EDX (solid angle 0.23 sr)
Gatan GMS 1.8, 32 bit.

Holders

Single tilt holders, double tilt holders (+- 30 degrees), cold stage holder, heating holder, environmental cell/transfer holder, tomography holders and a rotation holder.