Jeol JEM ARM200F - Double corrected ColdFEG microscope

Transmission electron microscopes (TEM)

Photo: Kim Ramberghaug/NTNU

The Jeol TEMs are included in a Jeol Competence Centre. The three Jeol TEMs installed in 2013 are part of the NORTEM project. Together they cover a broad range of techniques and access levels.

Ressurspublisering

Jeol JEM ARM200F - Double corrected ColdFEG microscope

This is one of the most advanced TEMs currently in Europe. The stable coldFEG with both probe and image spherical aberration correction and the most advanced EDX and EELS systems allow unique studies at the atomic scale. The microscope is placed in a custom designed room with water cooled walls and field cancellation.

The ARM200F has a large angle EDX, a fast dual EELS set-up and has both probe and image correction. This instrument is targeting at the highest performance currently available.

Cold field emission gun with energy spread of < 0.3 eV
Fully aligned at 80 and 200 kV
Cs-probe corrector (Resolution in HAADF < 1Å)
Cs-image corrector (Resolution in HRTEM < 1 Å)
Centurio SDD EDX (solid angle 0.98 sr)
Quantum GIF with DualEELS and 2k CCD
2k Orius CCD (side mounted) and 4k RIO CMOS (bottom mounted)
Quantum Detectors quad-chip (512x512) MerlinEM direct electron detector
Stable 5-axis gonio with piezo control in x, y and z-directions
Detectors for BF(2x), ABF, ADF, and HAADF(2x) STEM
Gatan GMS 2.3, 64 bit
Custom designed room with water cooled walls and ceiling and active field cancellation

Holders

Single tilt holders, single tilt reinforced, double tilt holders (+/- 30 degrees), double tilt reinforced, cold stage holder, heating holder, environmental cell/transfer holders, tomography holders and a rotation holder.