AFM - Equipment - NanoLab
Atomic force microscope (AFM)
General information:
AFM offers topographic measurements of surfaces with an accuracy in the nanometric scale. It is a useful tool for studying surfaces of various materials systems including inorganic materials.
The instrument can be used in contact, and tapping mode, and can also map lateral forces. It is designed for samples up to 15mm in diameter having a maximum thickness of 6mm. It is also possible to perform measurements in the temperature range of -35°C to 250°C in air or inert gas.
The AFM can in addition offer studies of soft materials, including the use of a liquid-cell. It is also possible to coat the tip making it sensitive to different active sites on the surface (demands user knowledge on functionalizing of the tip).
The software permits among other things, 3-D and 2-D presentations, multi scanning and 8 simultaneous scan- views for detailed investigations of specific areas of the sample.