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  1. Faculty of Natural Sciences Research Center for Advanced Microscopy (CAM)
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  3. BioScope Catalyst

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BioScope Catalyst AFM from Bruker - Center for Advanced Microscopy (CAM)

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BioScope Catalyst (AFM)

BioScope Catalyst (AFM)

– Atomic force microscope (AFM)

photoTIRF_Sherstova

Tatyana Sherstova using the high resolution TIRF microscope. Photo
The high resolution TIRF microscope. Photo: Per Henning/NTNU

Atomic force microscopy (AFM)

The atomic force microscope BioScope Catalyst from Bruker AXS is integrated with an inverted Axio Observer.

Z1 from Zeiss, allowing this high resolution imaging technique to be used simultaneously with fluorescent techniques (total internal reflection fluorescence or epi-fluorescence) or other contrast techniques (brightfield microscopy or phase contrast). It is specifically designed for bioscience applications. The spatial structures of biomolecules and cells can be identified in both air and fluid, under physiologically related conditions. With the PeakForce tapping mode, quantitative nanomechanical properties such as elastic modulus and adhesion can be mapped, together with sample topography. The sample holder supports standard microscope cover slips, slides and petri dishes.

Specifications

The microscope

The Axio Observer.Z1 is an inverted motorized microscope with a touch pad, equipped for brightfield and TIRF microscopy as well as AFM. It is equipped with Definite Focus for adaptive focus control, heater stage for live cell imaging and motorized objective nosepiece (z-step size 10 nm).

XY-range (the baseplate scan stage)

  • Motorized sample stage with nominal range 125 mm x 125 mm
  • Closed-loop X and Y piezo scanners, range 150 um x 150 um

Z-range (the BioScope catalyst scan head)

  • Stepping motor for coarse Z positioning, total range 8 mm
  • Closed-loop Z piezo scanner, range ca 25 um (0.1 nm RMS noise)

EasyAlign accessory

For simple alignment of the 850 nm IR light from the luminescent diode onto the cantilever tip, both in air and fluid.

Controller electronics

NanoScope V Controller

AFM operation modes

  • Contact mode
  • Tapping mode
  • Lateral force measurements
  • High-resolution nanolithography
  • PeakForce tapping mode (ScanAsyst)
  • Force mode: recording of force curves and force volume imaging
  • Quantitative nanomechanical property mapping (PeakForce QNM)

 

Camera

Andor iXon DU 897_BV EMCCD from Andor Technologies

 

Software on the AFM computer

  • Bruker Nanoscope version 8.. Using a special software module for microscope image registration, it is possible to overlay the AFM and the optical image.
  • Nanoscope Analysis version 1.40 for image processing and analysis.

 

Stage and incubation accessories

  • The baseplate scan stage from Bruker AXS with standard sample holder and motorized sample stage, controlled either manually, by the software or a joystick.
  • A heater stage for the baseplate, including temperature controller.
  • Perfusion accessories from Bruker AXS.

 

person-portlet

Contact

  • Astrid Bjørkøy

    Astrid Bjørkøy Senior Engineer

    +47-73593669 +4791897851 astrid.bjorkoy@ntnu.no Department of Physics

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